Leica Absolute Tracker ATS600
The First Ever Direct Scanning Laser Tracker
Manufacturers are increasingly interested in digitally pinpointing and inspecting large parts and surfaces that are simply out of range of a traditional handheld 3D laser scanner, touch probe or reflector. The Leica Absolute Tracker ATS600 is ready to meet the challenges of these new applications with a unique working principle that can accurately locate a point in 3D space with metrology-grade accuracy without the need for a reflector at the point of measurement.
Based on the established Wave-Form Digitiser technology behind some high-end surveying tools, the ATS600 is powered by the first ever Scanning Absolute Distance Meter, a metrology-grade iteration of this technical principle that can locate a point to within 300 microns from up to 60 metres away.
By measuring a series of such points across a user-definable measurement area, the ATS600 can quickly produce a measurement grid defining the target measurement surface. The density of that point-grid is also customisable, putting the operator in complete control of the balance between process speed and the level of detail that will feed into your metrology software.
With the Leica Absolute Tracker ATS600, objects that previously required significant time investments to digitise, or which were even beyond the realistic possibility of efficient measurement, can be quickly brought into the world of 3D analysis by a single operator. With the world’s first ‘direct scanning laser tracker’, productive quality control is primed to expand into entirely new areas of production, powered by a fundamental shift in the way we think about 3D measurement.
The ATS600 also delivers many of the features familiar from the rest of our Absolute Tracker product range, including reflector measurement at up to 80 metres distance, with full PowerLock capability. Combining reflector measurement and direct scanning capabilities delivers impressive all-round performance for large-scale measurement tasks, with scanning quickly describing surfaces and individual reflector readings used for alignment and defining features.
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